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Intern- YE Physical Failure Analysis Engineer

Micron Technology · Boise, ID - ID1 · On-site

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About Micron Technology

Micron is a global leader in memory and storage, powering AI and compute-intensive applications from cloud to edge with innovative semiconductor solutions.

About the role

Currently pursuing a Bachelor's or Master's degree in Electrical Engineering, Materials Science & Engineering, Physics, Chemical Engineering, or a related field. Found on 1752vc Careers, the job board for startup and VC roles.

What they're looking for

  • Basic understanding of semiconductor devices and fabrication processes
  • Hands-on lab experience is a plus (e.g., microscopy, SEM/FIB, sample preparation, cleanroom)
  • Strong attention to detail and good analytical and problem-solving skills
  • Clear written and verbal communication, able to summarize technical results simply
  • Familiarity with data tools (Excel, JMP, Python, etc.) is preferred
More about this role

Our vision is to transform how the world uses information to enrich life for all .

Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever.

Job Description

As a PFA Engineer Intern on the Yield Enhancement (YE) team, you will support physical failure analysis investigations of defect issues found by YE and Fab customers. You will learn to isolate, expose, and image physical defects in advanced memory devices, analyze the results to help find the root cause, and present clear findings to engineering partners. Alongside your daily work in the lab, you will complete a focused improvement project during the 3-month internship and present the results at the end. You will set your priorities following the YE PFA queue, with guidance from a mentor engineer.

Physical Failure Analysis and Investigation

  • Performs PFA sample preparation and analysis (e.g., deprocessing/delayering, cross-sectioning, FIB, SEM/TEM imaging) according to area skill guidelines.
  • Reviews EFA results, fault isolation data, and probe/yield data to decide...

Read the full posting on Micron Technology's site ↗

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