Renesas is one of the top global semiconductor companies in the world. We strive to develop a safer, healthier, greener, and smarter world, and our goal is to make every endpoint intelligent by offering product solutions in the automotive, industrial,...
About the role
We are seeking a highly motivated Staff Engineer, Defect Metrology to join our MOCVD team. This role will provide technical leadership in semiconductor defect inspection, data analytics, and development of advanced defect detection and classification capabilities. The ideal candidate combines hands-on semiconductor metrology experience with strong skills in Python, data analysis, image processing, and AI/ML to improve product quality, process control, and manufacturing yield. Found on 1752vc Careers, the job board for startup and VC roles.
What they're looking for
- BS with 5+ years, MS with 3+ years, or PhD in Engineering, Science, Data Science, Computer Science, or a related field
- Experience in semiconductor defect inspection, metrology, yield engineering, manufacturing analytics, image analysis, or a related area
- Strong data analysis and programming skills, preferably with Python and SQL
- Experience applying AI/ML, computer vision, statistical learning, or advanced analytics to engineering problems
- Experience working with large datasets, including data extraction, manipulation, statistical analysis, visualization, and correlation
- Familiarity with tools/libraries such as pandas, NumPy, scikit-learn, OpenCV, PyTorch, or TensorFlow is desirable
More about this role
We are seeking a highly motivated Staff Engineer, Defect Metrology to join our MOCVD team. This role will provide technical leadership in semiconductor defect inspection, data analytics, and development of advanced defect detection and classification capabilities. The ideal candidate combines hands-on semiconductor metrology experience with strong skills in Python, data analysis, image processing, and AI/ML to improve product quality, process control, and manufacturing yield.
- Develop image-processing algorithms and AI/ML models to detect, classify, and quantify semiconductor defects such as particles, pits, and scratches.
- Analyze large datasets from wafer inspection, metrology, and MOCVD processes to identify trends, correlations, anomalies, and root causes.
- Develop automated analysis and visualization workflows using Python, SQL, JMP, Excel, and related tools.
- Correlate incoming substrate defects with epitaxial defects and develop data-driven methods for substrate quality screening.
- Integrate defect, process, equipment, and wafer-level data to improve understanding of defect mechanisms and yield drivers.
- Partner with process, equipment, and development engineers to...
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